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Design for test, Design-for-Test (DFT) discussion, education, and best-practices, including Scan, ATPG, BIST, Memory BIST, Logic BIST, Test Compression, ...
www.dftdigest.com - 2009-02-08
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requirements management
analog
ic design
traceability tools
change management
management
system analysis
cad
project management
eda
traceability matrix
design
fault
take
ibist
asic
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